Material Analysis  And Characterization Facilities

Multitechnique Surface Analytical System | Scanning Electron Microscope | X-ray Diffractometer | Microhardness Testing Machine | Optical Microscope


Material characterization is becoming increasingly important in view of ever increasing demands on the performance related properties of materials. The theme of linking properties with microstructure and chemical composition plays a key role in systematic development of exotic materials, their behaviour in practical applications and understandings of materials processing technologies.

IN-HOUSE FACILITIES INCLUDE :
 

Multitechnique Surface Analytical System ( MSAS)
X-ray Photoelectron Spectroscopy (XPS)
Auger Electron Spectroscopy (AES)
Secondary Ion Mass Spectrometry (SIMS)
Technique Modes Main Use Required Samples
XPS Standard Monochromatic(Resolution 0.48 eV) Qualitative and Quantitative elemental analysis of sample surface PowderThin Film Coating
AES Standard(Electron Beam dia.> 100 nm)
SIMS Static and Dynamic Mass Range: 1 to 340

Surface characterization by XPS/AES Charges for Testing
For a single survey scan using standard source RS 1000
For a single survey scan for quantitative analysis using standard source Rs 1500
Upto 4 energy ranges in high resolution scan for standard source RS 4000
For sputter etching upto 20 minutes RS 2000
Depth profile per sample RS 12000
For area defined XPS Rs 2000
For element mapping upto 4 elements ( by AES) RS 6000
For depth profile per sample maximum 4 masses and 20 minutes (SIMS) RS 6000

 

Scanning Electron Microscope (SEM)
Imaging and Image Analysis
Energy Dispersive X-ray Analysis(EDX)
Wavelength Dispersive
X-ray Analysis (WDX)
Technique Modes Main Use Required Samples
SEM Imaging(Resolution 3.5 nm)(Magnification 5X to 30,00,00X)EDX/WDX Morphology and Topography of sample surface Defects, Inclusions etc.Elemental Analysis ( Qualitative & Quantitative) Powder,BulkThin Film Coating

Surface characterization by SEM Charges for Testing
Per sample for Imaging Rs 1500
For EDX per location Rs 2000
For WDX per location Rs 3000
For element mapping (upto 3 elements) Rs 5000


X-Ray Diffractometer (XRD)
Powder diffraction
Grazing incidence X-Ray diffraction
Stress / Texture Analysis
Technique Modes Main Use Required Samples
XRD (PTS 3000 by Rich-Seifert four circle Goniometer (č, 2č, ÷ & ö)) X-ray powder diffraction Grazing incidence X-ray diffraction Residual stress analysis on the material surface Crystallographic texture analysis  Phase Identification, Crystal Structure Phases in thin films Stress and Texture analysis Powder, thin Films & Implanted surfaces, Industrial materials

Surface characterization by XRD Charges for Testing
For powder diffractogram Rs 1000
For powder diffractogram with data analysis RS 1500
For a grazing incidence diffractogram RS 2000
For Quantitative analysis RS 6000
For texture analysis (pole figure) Rs 6000


Microhardness

Technique Modes Main Use Required Samples
Microhardness testing machine Vickers/Knoop Microhardness Measurement  

Surface characterization by Microhardness tester Charges for Testing
Per sample for 3 indentations and with one load Rs 300
Per sample analysis with profile Rs 1000

 Optical Microscope

Technique Modes Main Use

Required Samples
Optical Microscope Reflection /Transmission
( Magnification upto 1000X)		 Morphology, Microstructure  

Surface characterization Charges for Testing
Per sample for 3 photographs Rs 500


Surface characterization Charges for Testing
Contact angle measurement by goniometer Rs 100

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